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ETS
2011
IEEE
220views Hardware» more  ETS 2011»
12 years 6 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...
ICCAD
1998
IEEE
94views Hardware» more  ICCAD 1998»
13 years 11 months ago
Noise considerations in circuit optimization
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
Andrew R. Conn, Ruud A. Haring, Chandramouli Viswe...
DAC
1995
ACM
13 years 10 months ago
Feedback, Correlation, and Delay Concerns in the Power Estimation of VLSI Circuits
With the advent of portable and high-density microelectronic devices, the power dissipation of integrated circuits has become a critical concern. Accurate and e cient power estimat...
Farid N. Najm
EVOW
2000
Springer
13 years 10 months ago
Prediction of Power Requirements for High-Speed Circuits
Modern VLSI design methodologies and manufacturing technologies are making circuits increasingly fast. The quest for higher circuit performance and integration density stems from f...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...