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DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any ...
DFT
2006
IEEE
14 years 5 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...