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DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
SC
2004
ACM
14 years 24 days ago
Analysis and Performance Results of a Molecular Modeling Application on Merrimac
The Merrimac supercomputer uses stream processors and a highradix network to achieve high performance at low cost and low power. The stream architecture matches the capabilities o...
Mattan Erez, Jung Ho Ahn, Ankit Garg, William J. D...
MOBIHOC
2003
ACM
14 years 19 days ago
PAN: providing reliable storage in mobile ad hoc networks with probabilistic quorum systems
Reliable storage of data with concurrent read/write accesses (or query/update) is an ever recurring issue in distributed settings. In mobile ad hoc networks, the problem becomes e...
Jun Luo, Jean-Pierre Hubaux, Patrick Th. Eugster
AINA
2007
IEEE
14 years 1 months ago
Multi-Stage Real Time Health Monitoring via ZigBee in Smart Homes
We present a framework for a wireless health monitoring system within a smart home using ZigBee technology. Vital signals are collected and processed using a 3-tiered architecture...
S. Dagtas, G. Pekhteryev, Zafer Sahinoglu
DAC
2004
ACM
13 years 11 months ago
Statistical gate delay model considering multiple input switching
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
Aseem Agarwal, Florentin Dartu, David Blaauw