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VTS
1997
IEEE
90views Hardware» more  VTS 1997»
13 years 11 months ago
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Jonathan T.-Y. Chang, Edward J. McCluskey
SC
2009
ACM
14 years 2 months ago
Enabling high-fidelity neutron transport simulations on petascale architectures
The UNIC code is being developed as part of the DOE’s Nuclear Energy Advanced Modeling and Simulation (NEAMS) program. UNIC is an unstructured, deterministic neutron transport c...
Dinesh K. Kaushik, Micheal Smith, Allan Wollaber, ...
IEEEARES
2006
IEEE
14 years 1 months ago
Application of the Digraph Method in System Fault Diagnostics
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
E. M. Kelly, L. M. Bartlett
DAC
2009
ACM
14 years 2 months ago
Clock skew optimization via wiresizing for timing sign-off covering all process corners
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
Sari Onaissi, Khaled R. Heloue, Farid N. Najm
DAC
1994
ACM
13 years 11 months ago
Probabilistic Analysis of Large Finite State Machines
Regarding nite state machines as Markov chains facilitates the application of probabilistic methods to very large logic synthesis and formal veri cation problems. Recently, we ha...
Gary D. Hachtel, Enrico Macii, Abelardo Pardo, Fab...