Despite the advancements of concurrency theory in the past decades, practical concurrent programming has remained a challenging activity. Fundamental problems such as data races an...
A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
We propose a methodology for non-intrusive design of concurrently self-testable FSMs. Unlike duplication schemes, wherein a replica of the original FSM acts as a predictor-compara...
The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on im...
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...