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» Challenges in Physical Chip Design
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CASES
2008
ACM
13 years 11 months ago
Reducing pressure in bounded DBT code caches
Dynamic binary translators (DBT) have recently attracted much attention for embedded systems. The effective implementation of DBT in these systems is challenging due to tight cons...
José Baiocchi, Bruce R. Childers, Jack W. D...
CORR
2008
Springer
148views Education» more  CORR 2008»
13 years 9 months ago
Copper Electrodeposition for 3D Integration
Abstract-Two dimensional (2D) integration has been the traditional approach for IC integration. Increasing demands for providing electronic devices with superior performance and fu...
Rozalia Beica, Charles Sharbono, Tom Ritzdorf
ISCA
2006
IEEE
145views Hardware» more  ISCA 2006»
13 years 9 months ago
Techniques for Multicore Thermal Management: Classification and New Exploration
Power density continues to increase exponentially with each new technology generation, posing a major challenge for thermal management in modern processors. Much past work has exa...
James Donald, Margaret Martonosi
BMCBI
2004
169views more  BMCBI 2004»
13 years 8 months ago
A power law global error model for the identification of differentially expressed genes in microarray data
Background: High-density oligonucleotide microarray technology enables the discovery of genes that are transcriptionally modulated in different biological samples due to physiolog...
Norman Pavelka, Mattia Pelizzola, Caterina Vizzard...
ET
2002
122views more  ET 2002»
13 years 8 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter