13 search results - page 3 / 3 » Characterization of CMOS Defects using Transient Signal Anal... |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Continuing scaling of CMOS technology has allowed aggressive pursuant of increased clock rate in DSM chips. The ever shorter clock period has made switching times of di...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
— There is a growing interest in developing low cost, low power, highly integrated biosensor systems to characterize individual cells for applications such as cell analysis, drug...
CSE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Today’s wirelessly networked embedded systems underlie a vast array of electronic devices, performing computation, communication, and input/output. A major design goal...