2446 search results - page 295 / 490 » Characterizing the Performance of |
131
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ICCAD
2005
IEEE
16 years 1 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
145
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HPCA
2005
IEEE
15 years 9 months ago
2005
IEEE
As microprocessors become increasingly interconnected, the power consumed by the interconnection network can no longer be ignored. Moreover, with demand for link bandwidth increas...
146
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ECML
2006
Springer
15 years 7 months ago
2006
Springer
In many complex machine learning applications there is a need to learn multiple interdependent output variables, where knowledge of these interdependencies can be exploited to impr...
146
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DASFAA
2007
IEEE
15 years 6 months ago
2007
IEEE
To support emerging database applications that deal with continuously changing (or moving) data objects (CCDOs), such as vehicles, RFIDs, and multi-stimuli sensors, one requires an...
127
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VLSID
2007
IEEE
16 years 4 months ago
2007
IEEE
In this paper we explore the use of a set of novel design metrics for characterizing the impact of gate oxide tunneling current in nanometer CMOS devices and perform Monte Carlo s...