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DAC
2000
ACM
14 years 9 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
CODES
2006
IEEE
13 years 11 months ago
Automatic phase detection for stochastic on-chip traffic generation
During System on Chip (SoC) design, Network on Chip (NoC) prototyping is used for adapting NoC parameters to the application running on the chip. This prototyping is currently don...
Antoine Scherrer, Antoine Fraboulet, Tanguy Risset
NIPS
2003
13 years 9 months ago
A Mixed-Signal VLSI for Real-Time Generation of Edge-Based Image Vectors
A mixed-signal image filtering VLSI has been developed aiming at real-time generation of edge-based image vectors for robust image recognition. A four-stage asynchronous median de...
Masakazu Yagi, Hideo Yamasaki, Tadashi Shibata
VTS
2008
IEEE
83views Hardware» more  VTS 2008»
14 years 2 months ago
LS-TDF: Low-Switching Transition Delay Fault Pattern Generation
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
Jeremy Lee, Mohammad Tehranipoor
DAC
2007
ACM
14 years 9 months ago
Physical Unclonable Functions for Device Authentication and Secret Key Generation
Physical Unclonable Functions (PUFs) are innovative circuit primitives that extract secrets from physical characteristics of integrated circuits (ICs). We present PUF designs that...
G. Edward Suh, Srinivas Devadas