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DATE
2010
IEEE
171views Hardware» more  DATE 2010»
14 years 29 days ago
Digital statistical analysis using VHDL
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Manfred Dietrich, Uwe Eichler, Joachim Haase
VTS
2002
IEEE
113views Hardware» more  VTS 2002»
14 years 23 days ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
DNA
2001
Springer
14 years 10 days ago
The Fidelity of the Tag-Antitag System
In the universal DNA chip method, target RNAs are mapped onto a set of DNA tags. Parallel hybridization of these tags with an indexed, complementary antitag array then provides an ...
John A. Rose, Russell J. Deaton, Masami Hagiya, Ak...
CVPR
2000
IEEE
14 years 8 days ago
Segmentation with Invisible Keying Signal
Croma keying is the process of segmenting objects from images and video using color cues. A blue (or green) screen placed behind an object during recording is used in special effe...
Moshe Ben-Ezra
ISCA
2000
IEEE
81views Hardware» more  ISCA 2000»
14 years 7 days ago
Clock rate versus IPC: the end of the road for conventional microarchitectures
The doubling of microprocessor performance every three years has been the result of two factors: more transistors per chip and superlinear scaling of the processor clock with tech...
Vikas Agarwal, M. S. Hrishikesh, Stephen W. Keckle...