96 search results - page 4 / 20 » Circuit modeling for practical many-core architecture design... |
VLSID
2008
IEEE
14 years 8 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
CSUR
2006
13 years 7 months ago
2006
resents a perspective on existing NoC research. We define the following abstractions: system, network adapter, network, and link to explain and structure the fundamental concepts. ...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
An approach to robust system level mixed signal design is presented based on analog platforms. The bottom-up characterization phase of platform components provides accurate perfor...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
This paper presents the Quantum-Dot Cellular Automata (QCA) physical design problem, in the context of the VLSI physical design problem. The problem is divided into three subprobl...
DFT
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents a system to evaluate the testability of an on-line testable circuit. The system operates at the RT-level, before the logic synthesis step, and allows for an ex...