We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
A new partitioningapproach for very largecircuits is described. We demonstrate that applying a recently developed analytical placement algorithm, that prots from a linear objecti...
This paper advances a new methodology based on signal-path information to resolve the problem of device-level placement for analog layout. This methodology is mainly based on three...
The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on im...