Current advances in chip design and manufacturing have allowed IC manufacturing to approach the nanometer range. As the feature size scales down, greater variability is experience...
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
Smita Krishnaswamy, Stephen Plaza, Igor L. Markov,...
Throughput, power consumption, signal integrity, pin count and routing complexity are all increasingly important interconnect issues that the system designer must deal with. Recen...
Advances in IC processing allow for more microprocessor design options. The increasing gate density and cost of wires in advanced integrated circuit technologies require that we l...
Kunle Olukotun, Basem A. Nayfeh, Lance Hammond, Ke...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...