1108 search results - page 131 / 222 » Clustered Level Planarity |
MICRO
2008
IEEE
14 years 4 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
CIARP
2008
Springer
14 years 2 days ago
2008
Springer
This paper shows that there exist linear models for sensor pose estimation for multi-view panoramas defined by a symmetric or leveled pair of cylindric images. It assumes that pair...
EGITALY
2006
13 years 11 months ago
2006
In recent years the progress of 3D scanning technologies and the consequent growing commercialization of scanners opened a large spectrum of opportunities for many professionals. ...
ECCV
2008
Springer
14 years 12 months ago
2008
Springer
Abstract. We describe a new method for unsupervised structure learning of a hierarchical compositional model (HCM) for deformable objects. The learning is unsupervised in the sense...
KDD
2002
ACM
14 years 10 months ago
2002
ACM
The goal of the knowledge discovery and data mining is to extract the useful knowledge from the given data. Visualization enables us to find structures, features, patterns, and re...