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ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
14 years 2 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
KBSE
2008
IEEE
14 years 4 months ago
DiffGen: Automated Regression Unit-Test Generation
— Software programs continue to evolve throughout their lifetime. Maintenance of such evolving programs, including regression testing, is one of the most expensive activities in ...
Kunal Taneja, Tao Xie
SIGMOD
2008
ACM
65views Database» more  SIGMOD 2008»
14 years 10 months ago
Generating targeted queries for database testing
Tools for generating test queries for databases do not explicitly take into account the actual data in the database. As a consequence, such tools cannot guarantee suitable coverag...
Chaitanya Mishra, Nick Koudas, Calisto Zuzarte
SIGSOFT
2007
ACM
14 years 10 months ago
The impact of input domain reduction on search-based test data generation
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
Mark Harman, Youssef Hassoun, Kiran Lakhotia, Phil...
SAC
2006
ACM
13 years 9 months ago
A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
Kai Chen, Fan Jiang, Chuan-dong Huang