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VTS
1997
IEEE
133views Hardware» more  VTS 1997»
14 years 2 months ago
ATPG for scan chain latches and flip-flops
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
Samy Makar, Edward J. McCluskey
ICSE
2008
IEEE-ACM
14 years 10 months ago
Continuous software quality supervision using SourceInventory and Columbus
Several tools and methods for source code quality assurance based on static analysis finally reached a state when they are applicable in practice and recognized by the industry. H...
Árpád Beszédes, Rudolf Ferenc...
EDM
2009
179views Data Mining» more  EDM 2009»
13 years 7 months ago
Learning Factors Transfer Analysis: Using Learning Curve Analysis to Automatically Generate Domain Models
This paper describes a novel method to create a quantitative model of an educational content domain of related practice item-types using learning curves. By using a pairwise test t...
Philip I. Pavlik Jr., Hao Cen, Kenneth R. Koedinge...
PASTE
2005
ACM
14 years 3 months ago
Automatically generating refactorings to support API evolution
When library APIs change, client code should change in response, in order to avoid erroneous behavior, compilation failures, or warnings. Previous research has introduced techniqu...
Jeff H. Perkins
ICPR
2010
IEEE
14 years 3 months ago
Comparative Testing of Face Detection Algorithms
Abstract. Face detection (FD) is widely used in interactive user interfaces, in advertising industry, entertainment services, video coding, is necessary first stage for all face r...
Nikolay Degtyarev, Oleg Seredin