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TNN
2010
13 years 3 months ago
2010
Abstract--In this paper, the problem of stochastic synchronization analysis is investigated for a new array of coupled discretetime stochastic complex networks with randomly occurr...
PDP
2011
IEEE
13 years 14 days ago
2011
IEEE
Abstract—Continuously reducing transistor sizes and aggressive low power operating modes employed by modern architectures tend to increase transient error rates. Concurrently, mu...
EUROPAR
2011
Springer
12 years 8 months ago
2011
Springer
Abstract. ILU(k) is a commonly used preconditioner for iterative linear solvers for sparse, non-symmetric systems. It is often preferred for the sake of its stability. We present T...
HPCA
2006
IEEE
14 years 9 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
Abstract—While prior research has extensively evaluated the performance advantage of moving from a 2D to a 3D design style, the impact of process parameter variations on 3D desig...