3 search results - page 1 / 1 » Compact Dictionaries for Fault Diagnosis in BIST |
ISQED
2003
IEEE
14 years 11 days ago
2003
IEEE
We present a new technique for generating compact dictionaries for cause-effect diagnosis in BIST. This approach relies on the use of three compact dictionaries: (i) D1, containin...
DATE
2002
IEEE
14 years 1 days ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
DATE
2010
IEEE
14 years 5 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...