229 search results - page 12 / 46 » Compaction Schemes with Minimum Test Application Time |
ISCAS
1999
IEEE
14 years 9 days ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Systems based on satellite localization are enabling new scenarios for road charging schemes by offering the possibility to charge drivers as a function of their road usage. An ...
CORR
2010
Springer
13 years 8 months ago
2010
Springer
Signals comprised of a stream of short pulses appear in many applications including bio-imaging, radar, and ultrawideband communication. Recently, a new framework, referred to as f...
ICPP
1995
IEEE
13 years 11 months ago
1995
IEEE
– In this paper we present experiments with a class of graph partitioning algorithms that reduce the size of the graph by collapsing vertices and edges, partition the smaller gra...
CP
2009
Springer
14 years 8 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...