229 search results - page 38 / 46 » Compaction Schemes with Minimum Test Application Time |
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
ISBI
2004
IEEE
14 years 8 months ago
2004
IEEE
We present a novel method of statistical surface-based morphometry based on the use of non-parametric permutation tests. In order to evaluate morphologicaldifferences of brain str...
HPCA
2009
IEEE
14 years 8 months ago
2009
IEEE
The number of functional errors escaping design verification and being released into final silicon is growing, due to the increasing complexity and shrinking production schedules ...
SENSYS
2004
ACM
14 years 1 months ago
2004
ACM
Previous approaches for computing duplicate-sensitive aggregates in sensor networks (e.g., in TAG) have used a tree topology, in order to conserve energy and to avoid double-count...
DAC
2005
ACM
14 years 9 months ago
2005
ACM
Many reconfigurable architectures offer partial dynamic configurability, but current system-level tools cannot guarantee feasible implementations when exploiting this feature. We ...