138 search results - page 10 / 28 » Compaction-based test generation using state and fault infor... |
ISQED
2002
IEEE
14 years 12 days ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
VLSID
1998
IEEE
13 years 11 months ago
1998
IEEE
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
FTCS
1998
13 years 8 months ago
1998
The traditional use of formal methods has been for the veri cation of algorithms or protocols. Given the high cost and limitations in state space coverage provided by conventional...
ICECCS
2002
IEEE
14 years 13 days ago
2002
IEEE
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...