138 search results - page 13 / 28 » Compaction-based test generation using state and fault infor... |
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
27
Voted
TSMC
2011
13 years 2 months ago
2011
— Most state-based approaches to fault diagnosis of discrete-event systems require a complete and accurate model of the system to be diagnosed. In this paper, we address the prob...
SEFM
2005
IEEE
14 years 1 months ago
2005
IEEE
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...