Sciweavers

138 search results - page 14 / 28
» Compaction-based test generation using state and fault infor...
Sort
View
ISSTA
2012
ACM
11 years 10 months ago
Swarm testing
Swarm testing is a novel and inexpensive way to improve the diversity of test cases generated during random testing. Increased diversity leads to improved coverage and fault detec...
Alex Groce, Chaoqiang Zhang, Eric Eide, Yang Chen,...
DATE
2000
IEEE
130views Hardware» more  DATE 2000»
13 years 12 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
ICSE
2005
IEEE-ACM
14 years 7 months ago
Testing database transactions with AGENDA
AGENDA is a tool set for testing relational database applications. An earlier prototype was targeted to applications consisting of a single query and included components for popul...
Yuetang Deng, Phyllis G. Frankl, David Chays
VTS
1998
IEEE
97views Hardware» more  VTS 1998»
13 years 11 months ago
On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Mat...
IEEEARES
2006
IEEE
14 years 1 months ago
Application of the Digraph Method in System Fault Diagnostics
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
E. M. Kelly, L. M. Bartlett