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VTS   1998 IEEE VLSI Test Symposium
Wall of Fame | Most Viewed VTS-1998 Paper
VTS
1998
IEEE
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14 years 4 months ago
A Test Pattern Generation Methodology for Low-Power Consumption
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
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