138 search results - page 20 / 28 » Compaction-based test generation using state and fault infor... |
CCE
2004
13 years 7 months ago
2004
The Resource-Constrained Project Scheduling Problem(RCPSP) is a significant challenge in highly regulated industries, such as pharmaceuticals and agrochemicals, where a large numb...
ICSM
2005
IEEE
14 years 1 months ago
2005
IEEE
Test suite reduction is an important test maintenance activity that attempts to reduce the size of a test suite with respect to some criteria. Emerging trends in software developm...
DATE
2003
IEEE
14 years 24 days ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
GLVLSI
2003
IEEE
14 years 24 days ago
2003
IEEE
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
KBSE
2009
IEEE
14 years 2 months ago
2009
IEEE
—We investigate claims and assumptions made in several recent papers about fault localization (FL) techniques. Most of these claims have to do with evaluating FL accuracy. Our in...