138 search results - page 3 / 28 » Compaction-based test generation using state and fault infor... |
ICST
2010
IEEE
13 years 5 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...
SIGSOFT
2010
ACM
13 years 2 months ago
2010
ACM
Although a number of automatic tools have been developed to detect faults, much of the diagnosis is still being done manually. To help with the diagnostic tasks, we formally intro...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
TCAD
1998
13 years 7 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...