138 search results - page 4 / 28 » Compaction-based test generation using state and fault infor... |
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
IPPS
2009
IEEE
14 years 2 months ago
2009
IEEE
Given a set of n different deterministic finite state machines (DFSMs) modeling a distributed system, we examine the problem of tolerating f crash or Byzantine faults in such a ...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
ECOOP
2006
Springer
13 years 11 months ago
2006
Springer
A test case consists of two parts: a test input to exercise the program under test and a test oracle to check the correctness of the test execution. A test oracle is often in the f...