138 search results - page 6 / 28 » Compaction-based test generation using state and fault infor... |
ECOOP
2000
Springer
13 years 11 months ago
2000
Springer
We have recently shown how use cases can be systematically transformed into UML state charts considering all relevant information from a use case specification, including pre- and ...
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
CISS
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—Fault detection plays an indispensable role in ensuring the security of smart grid systems. Based on the dynamics of the generators, we show the time evolution of the sm...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...