331 search results - page 48 / 67 » Comparing Reductions to NP-Complete Sets |
115
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FMCAD
2009
Springer
15 years 10 months ago
2009
Springer
—Given an erroneous design, functional verification returns an error trace exhibiting a mismatch between the specification and the implementation of a design. Automated design ...
110
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DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
– With the rapid increase of design complexity and the decrease of device features in nano-scale technologies, interconnection optimization in digital systems becomes more and mo...
158
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DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
Leakage power is a serious concern in nanometer CMOS technologies. In this paper we focus on leakage reduction through automatic insertion of sleep transistors for power gating in...
124
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ISCAS
2008
IEEE
15 years 10 months ago
2008
IEEE
Abstract— Especially for tasks like automatic meeting transcription, it would be useful to automatically recognize speech also while multiple speakers are talking simultaneously....
127
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...