2735 search results - page 266 / 547 » Comparing notions of randomness |
ICML
2000
IEEE
14 years 11 months ago
2000
IEEE
This paper explores in detail the use of Error Correcting Output Coding (ECOC) for learning text classifiers. We show that the accuracy of a Naive Bayes Classifier over text class...
VLSID
2008
IEEE
14 years 11 months ago
2008
IEEE
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
VLSID
2007
IEEE
14 years 11 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
DCC
2008
IEEE
14 years 10 months ago
2008
IEEE
Recent advances in compressed data structures have led to the new concept of self-indexing; it is possible to represent a sequence of symbols compressed in a form that enables fas...
ICCD
2004
IEEE
14 years 7 months ago
2004
IEEE
— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...