— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a time-of-flight camera. These ToF cameras can measure depth scans ...
Christian Theobalt, Yan Cui, Sebastian Schuon, Seb...
Let P be a set of points in Rd . We propose GEOFILTERKRUSKAL, an algorithm that computes the minimum spanning tree of P using well separated pair decomposition in combination with ...
—The ubiquity of mobile devices has brought forth the concept of participatory sensing, whereby ordinary citizens can now contribute and share information from the urban environm...