As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
Smita Krishnaswamy, Stephen Plaza, Igor L. Markov,...
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
—As semiconductor technology scales into the deep submicron regime the occurrence of transient or soft errors will increase. This will require new approaches to error detection. ...
The process of computing the physical locations of nodes in a wireless sensor network is known as localization. Selflocalization is critical for large-scale sensor networks becaus...