4647 search results - page 287 / 930 » Composite Design Patterns |
132
Voted
VTS
2008
IEEE
15 years 9 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
113
Voted
ADMA
2006
Springer
15 years 8 months ago
2006
Springer
Feature selection is an important data preprocessing step in data mining and pattern recognition. Many algorithms have been proposed in the past for simple patterns that can be cha...
128
Voted
IWCMC
2006
ACM
15 years 8 months ago
2006
ACM
Wireless sensors use low power radio transceivers due to the stringent constraints on battery capacity. As a result, radio transmission with wireless sensors is unreliable. Furthe...
122
Voted
VTS
1995
IEEE
15 years 6 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
117
Voted
WICSA
2004
15 years 4 months ago
2004
In this paper, we present an approach to improve the software architecture evaluation process by systematically extracting and appropriately documenting architecturally significan...