565 search results - page 6 / 113 » Compositional dynamic test generation |
DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
ECOOP
2000
Springer
13 years 11 months ago
2000
Springer
We have recently shown how use cases can be systematically transformed into UML state charts considering all relevant information from a use case specification, including pre- and ...
EDCC
2005
Springer
14 years 28 days ago
2005
Springer
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
MIDDLEWARE
2009
Springer
13 years 12 months ago
2009
Springer
Abstract. The performance of multi-tier systems is known to be significantly degraded by workloads that place bursty service demands on system resources. Burstiness can cause queu...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...