The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
The recently proposed method for image compression based on multi-scale recurrent patterns, the MMP (Multidimensional Multiscale Parser) has been shown to perform well for a large...
Eddie B. L. Filho, Murilo B. de Carvalho, Eduardo ...
In this paper we describe the ongoing work on a new paradigm for compressing the motion predicted error in a video coder, referred to as MMP-Video. This new coding algorithm uses ...
Eduardo A. B. da Silva, Murilo B. de Carvalho, Nun...