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» Compressing Functional Tests for Microprocessors
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ITC
2003
IEEE
205views Hardware» more  ITC 2003»
14 years 18 days ago
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Ki...
MTV
2005
IEEE
138views Hardware» more  MTV 2005»
14 years 27 days ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
VLSISP
2008
173views more  VLSISP 2008»
13 years 7 months ago
Fast Bit Gather, Bit Scatter and Bit Permutation Instructions for Commodity Microprocessors
Advanced bit manipulation operations are not efficiently supported by commodity word-oriented microprocessors. Programming tricks are typically devised to shorten the long sequence...
Yedidya Hilewitz, Ruby B. Lee
ASAP
2006
IEEE
111views Hardware» more  ASAP 2006»
14 years 1 months ago
Fast Bit Compression and Expansion with Parallel Extract and Parallel Deposit Instructions
Current microprocessor instruction set architectures are word oriented, with some subword support. Many important applications, however, can realize substantial performance benefi...
Yedidya Hilewitz, Ruby B. Lee
DATE
2002
IEEE
100views Hardware» more  DATE 2002»
14 years 9 days ago
AccuPower: An Accurate Power Estimation Tool for Superscalar Microprocessors
This paper describes the AccuPower toolset -- a set of simulation tools accurately estimating the power dissipation within a superscalar microprocessor. AccuPower uses a true hard...
Dmitry Ponomarev, Gurhan Kucuk, Kanad Ghose