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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
13 years 12 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
DAC
2003
ACM
14 years 24 days ago
Efficient compression and application of deterministic patterns in a logic BIST architecture
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
ICIP
2004
IEEE
14 years 9 months ago
Multidimensional signal compression using multi-scale recurrent patterns with smooth side-match criterion
The recently proposed method for image compression based on multi-scale recurrent patterns, the MMP (Multidimensional Multiscale Parser) has been shown to perform well for a large...
Eddie B. L. Filho, Murilo B. de Carvalho, Eduardo ...
ICIP
2008
IEEE
14 years 9 months ago
3D weather radar image compression using multiscale recurrent patterns
Athayde L. V. Frauche, Murilo B. de Carvalho, Edua...
ICIP
2006
IEEE
14 years 9 months ago
Improving H.264/AVC Inter Compression with Multiscale Recurrent Patterns
In this paper we describe the ongoing work on a new paradigm for compressing the motion predicted error in a video coder, referred to as MMP-Video. This new coding algorithm uses ...
Eduardo A. B. da Silva, Murilo B. de Carvalho, Nun...