Process variation has become a critical problem in modern VLSI fabrication. In the presence of process variation, buffer insertion problem under performance constraints becomes mo...
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Abstract. We propose CUSTARD — CUStomisable Threaded ARchitecture — a soft processor design space that combines support for multiple hardware threads and automatically generate...
This paper introduces thread integration, a new method of providing low-cost concurrency for microcontrollers and microprocessors. This post-pass compiler technology effectively i...
Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...