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DAC
2009
ACM
16 years 4 months ago
SRAM parametric failure analysis
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
Jian Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileg...
109
Voted
DAC
2007
ACM
16 years 4 months ago
Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
Tao Li, Zhiping Yu
119
Voted
SIGSOFT
2009
ACM
16 years 4 months ago
Static data race detection for concurrent programs with asynchronous calls
A large number of industrial concurrent programs are being designed based on a model which combines threads with event-based communication. These programs consist of several threa...
Vineet Kahlon, Nishant Sinha, Erik Kruus, Yun Zhan...
KDD
2003
ACM
152views Data Mining» more  KDD 2003»
16 years 4 months ago
Interactive exploration of coherent patterns in time-series gene expression data
Discovering coherent gene expression patterns in time-series gene expression data is an important task in bioinformatics research and biomedical applications. In this paper, we pr...
Daxin Jiang, Jian Pei, Aidong Zhang
138
Voted
VLSID
2005
IEEE
224views VLSI» more  VLSID 2005»
16 years 4 months ago
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...