2254 search results - page 59 / 451 » Computing the minimal covering set |
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
As a basic cell of arithmetic circuits, a one-bit full adder and a counter are usually used. Minimizing power consumption of these components is a key issue for low-power circuit ...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
SOFSEM
2012
Springer
12 years 5 months ago
2012
Springer
The classical group testing problem asks to determine at most d defective elements in a set of n elements, by queries to subsets that return Yes if the subset contains some defecti...
SCALESPACE
2009
Springer
14 years 4 months ago
2009
Springer
The proposed method is related to parametric and geodesic active contours as well as minimal paths, in the context of image segmentation 1 . Our geodesically linked active contour ...
SIAMCOMP
1998
13 years 9 months ago
1998
A chain of a set P of n points in the plane is a chain of the dominance order on P. A k-chain is a subset C of P that can be covered by k chains. A k-chain C is a maximum k-chain ...