112 search results - page 8 / 23 » Concurrent Error Detection in S-boxes |
DFT
2008
IEEE
14 years 1 months ago
2008
IEEE
The paper presents a new technique for designing a concurrently checking combinational circuit. The technique is based on partitioning the circuit into two independent sub-circuit...
VLSID
2003
IEEE
14 years 7 months ago
2003
IEEE
We propose a non-intrusive methodology for concurrent fault detection in FSMs. The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor ...
ISQED
2003
IEEE
14 years 23 days ago
2003
IEEE
We discuss a non-intrusive methodology for concurrent fault detection in random combinational logic. The proposed method is similar to duplication, wherein a replica of the circui...
VTS
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper presents a new technique for on-line consistency checking of embedded DRAMs. The basic idea is to use the periodic refresh operation for concurrently computing a test c...
ASPLOS
2010
ACM
14 years 2 months ago
2010
ACM
This paper presents a randomized scheduler for finding concurrency bugs. Like current stress-testing methods, it repeatedly runs a given test program with supplied inputs. Howeve...