62 search results - page 2 / 13 » Concurrent Fault Detection in Random Combinational Logic |
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
DSD
2010
IEEE
13 years 8 months ago
2010
IEEE
— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
CDES
2007
13 years 11 months ago
2007
—Fault collapsing is the process of reducing the number of faults by using redundance and equivalence/dominance relationships among faults. Exact global fault collapsing can be e...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a concurrent error detection technique for the control logic of a modern microprocessor. Our method is based on execution time prediction for each instruction ...
IJCSA
2007
13 years 9 months ago
2007
In this paper we present low -cost, concurrent checking methods for multiple error detection in S-boxes of symmetric block ciphers. These are redundancy-based fault detection sche...