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ICST
2009
IEEE
15 years 11 months ago
Pruning the Search Space in Path-Based Test Generation
Sébastien Bardin, Philippe Herrmann
109
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ISSRE
2008
IEEE
15 years 11 months ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos