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    IEEE
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    SPIN-TEST: automatic test pattern generation for speed-independent circuits

    14 years 9 months ago
    SPIN-TEST: automatic test pattern generation for speed-independent circuits
    Download  www.eng.yale.edu
    Feng Shi, Yiorgos Makris
    claim paper
    Added 16 Mar 2010
    Updated 16 Mar 2010
    Type Conference
    Year 2004
    Where ICCAD
    Authors Feng Shi, Yiorgos Makris
    Comments (0)
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