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    GLVLSI
    1997
    IEEE
    92views VLSI» more  GLVLSI 1997»
    On Generating Test Sets that Remain Valid in the Presence of Undetected Faults
    15 years 8 months ago
    On Generating Test Sets that Remain Valid in the Presence of Undetected Faults
    Download  www.cs.york.ac.uk
    Irith Pomeranz, Sudhakar M. Reddy
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    INFOCOM
    1996
    IEEE
    105views Communications» more  INFOCOM 1996»
    Context Independent Unique Sequences Generation for Protocol Testing
    15 years 8 months ago
    Context Independent Unique Sequences Generation for Protocol Testing
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    T. Ramalingom, Krishnaiyan Thulasiraman, Anindya D...
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    103
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    ITC
    1996
    IEEE
    78views Hardware» more  ITC 1996»
    Identification and Test Generation for Primitive Faults
    15 years 8 months ago
    Identification and Test Generation for Primitive Faults
    Download  cadlab.ece.ucsb.edu
    Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad...
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    ISMVL
    1994
    IEEE
    94views Hardware» more  ISMVL 1994»
    Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits
    15 years 8 months ago
    Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits
    Download  web.it.kth.se
    Elena Dubrova, Dilian Gurov, Jon C. Muzio
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    202
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    AMOST
    2007
    ACM
    269views Software Engineering» more  AMOST 2007»
    Test purpose generation in an industrial application
    15 years 8 months ago
    Test purpose generation in an industrial application
    Download  www.ist.tugraz.at
    Bernhard K. Aichernig, Martin Weiglhofer, Bernhard...
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