4299 search results - page 15 / 860 » Concurrent Test Generation |
KBSE
2007
IEEE
14 years 2 months ago
2007
IEEE
There are many difficulties associated with developing correct multithreaded software, and many of the activities that are simple for single threaded software are exceptionally ha...
IOLTS
2002
IEEE
14 years 1 months ago
2002
IEEE
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
ERSHOV
2003
Springer
14 years 1 months ago
2003
Springer
The article presents an approach to model based testing of complex systems based on a generalization of finite state machines (FSM) and input output state machines (IOSM). The app...
ICCD
2002
IEEE
14 years 1 months ago
2002
IEEE
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
TVLSI
2008
13 years 8 months ago
2008
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...