4299 search results - page 24 / 860 » Concurrent Test Generation |
APSEC
1998
IEEE
14 years 21 days ago
1998
IEEE
This paper describes an automated approach to generating test cases for an object-oriented class. The approach is derived from state-based testing methods and refers to a state ma...
DELTA
2008
IEEE
14 years 2 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
QSIC
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...
ATAL
2008
Springer
13 years 10 months ago
2008
Springer
We introduce eCAT, a tool that supports deriving test cases semi-automatically from goal-based analysis diagrams, generates meaningful test inputs based on agent interaction ontol...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...