4299 search results - page 33 / 860 » Concurrent Test Generation |
CONCURRENCY
2008
13 years 8 months ago
2008
We present a proposal for a next-generation Internet based on chargeable Web Services and Utility Computing realised by a series of open but interacting markets. We demonstrate thr...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
ATS
2004
IEEE
14 years 6 days ago
2004
IEEE
TIS (Test Instruction Set) is an instruction level technique for CPU core self-testing. This method is based on enhancing a CPU instruction set with test instructions. TIS replace...
SIGMOD
2008
ACM
14 years 8 months ago
2008
ACM
Timing-related defects are among the most difficult types of defects to catch while testing software. They are by definition difficult to reproduce and hence they are difficult to...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...