4299 search results - page 39 / 860 » Concurrent Test Generation |
ASPDAC
2006
ACM
14 years 2 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
DATE
1999
IEEE
14 years 24 days ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
CSL
2009
Springer
14 years 3 months ago
2009
Springer
This paper investigates a methodology of using FM (Fraenkel-Mostowski) sets, and the ideas of nominal set theory, to adjoin name generation to a semantic theory. By developing a d...
MICRO
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract--Parallel programming is hard, because it is impractical to test all possible thread interleavings. One promising approach to improve a multi-threaded program's relia...
FATES
2004
Springer
14 years 1 months ago
2004
Springer
We present an extension of Tretmans’ theory and algorithm for test generation for input-output transition systems to real-time systems. Our treatment is based on an operational i...