- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
This paper investigates a methodology of using FM (Fraenkel-Mostowski) sets, and the ideas of nominal set theory, to adjoin name generation to a semantic theory. By developing a d...
Abstract--Parallel programming is hard, because it is impractical to test all possible thread interleavings. One promising approach to improve a multi-threaded program's relia...
We present an extension of Tretmans’ theory and algorithm for test generation for input-output transition systems to real-time systems. Our treatment is based on an operational i...