4299 search results - page 46 / 860 » Concurrent Test Generation |
KBSE
1999
IEEE
14 years 24 days ago
1999
IEEE
Modularization and abstraction are the keys to practical verification and analysis of large and complex systems. We present in an incremental methodology for the automatic analysi...
VEE
2012
ACM
12 years 4 months ago
2012
ACM
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
COMPSAC
2010
IEEE
13 years 6 months ago
2010
IEEE
An important goal of automatic testing techniques, including random testing is to achieve high code coverage with a minimum set of test cases. To meet this goal, random testing res...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an approach where a production tester is extended by a memory test engine (MTE). ...
AIPS
2000
13 years 10 months ago
2000
This paper develops Probabilistic Hybrid Action Models (PHAMs), a realistic causal model for predicting the behavior generated by modern concurrent percept-driven robot plans. PHA...